Small defects such as scratches, dents, and residual copper are difficult to stably quantify through ordinary AOI.
LightE uses a chromatic confocal displacement sensor to perform high-speed height scanning to identify small height anomalies.
Small defects such as scratches, dents, and residual copper are difficult to stably quantify through ordinary AOI.
LightE uses a chromatic confocal displacement sensor to perform high-speed height scanning to identify small height anomalies.