芯片封装后整体高度与段差检测,立仪科技应用案例封面图

Overall height and step detection after chip packaging

After the chip packaging is completed, there are height differences in different structural areas. If the tolerance is exceeded, module assembly and reliability will be affected. LightE provides a non-contact height measurement solution to accurately detect key areas of packaged devices to ensure that the height and step height meet design requirements.