{"id":881,"date":"2026-03-17T15:29:53","date_gmt":"2026-03-17T07:29:53","guid":{"rendered":"https:\/\/lighte.gongjionline.cn\/cus_case\/pcb-biao-mian-wei-xiao-que-xian-gao-du-jian-ce\/"},"modified":"2026-08-25T17:49:59","modified_gmt":"2026-08-25T09:49:59","slug":"surface-defect-height-2","status":"publish","type":"case","link":"https:\/\/www.lightegroup.com\/es\/case\/surface-defect-height-2\/","title":{"rendered":"Detecci\u00f3n de la altura de defectos diminutos en la superficie de la PCB"},"content":{"rendered":"<p>Defectos peque\u00f1os como rayaduras, abolladuras y restos de cobre son dif\u00edciles de cuantificar de manera estable mediante sistemas AOI convencionales.<\/p>\n<p>LightE utiliza un sensor de desplazamiento confocal crom\u00e1tico para realizar escaneos de altura a alta velocidad y detectar peque\u00f1as anomal\u00edas en la altura.<\/p>","protected":false},"featured_media":3742,"template":"","meta":{"_acf_changed":false,"_seopress_robots_primary_cat":"","_seopress_titles_title":"Height detection of tiny defects on PCB surface - LightE Application","_seopress_titles_desc":"Small defects such as scratches, dents, and residual copper are difficult to stably quantify through ordinary AOI.","_seopress_robots_index":"","_seopress_analysis_target_kw":""},"class_list":["post-881","case","type-case","status-publish","has-post-thumbnail","hentry"],"acf":[],"_links":{"self":[{"href":"https:\/\/www.lightegroup.com\/es\/wp-json\/wp\/v2\/case\/881","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.lightegroup.com\/es\/wp-json\/wp\/v2\/case"}],"about":[{"href":"https:\/\/www.lightegroup.com\/es\/wp-json\/wp\/v2\/types\/case"}],"wp:featuredmedia":[{"embeddable":true,"href":"https:\/\/www.lightegroup.com\/es\/wp-json\/wp\/v2\/media\/3742"}],"wp:attachment":[{"href":"https:\/\/www.lightegroup.com\/es\/wp-json\/wp\/v2\/media?parent=881"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}